Kai-Feng Chen (NTU/ASIAA); Masamune Oguri (UTokyo/iPMU); Yen-Ting Lin (ASIAA); Satoshi Miyazaki (NAOJ/Sokendai)
In this talk, we will present a detailed estimate of the Eddington bias on weak-lensing mass measurements of shear-selected galaxy cluster samples. Large samples of shear-selected clusters available in future surveys will provide an additional candidate to probe cluster cosmology and study cluster astrophysics with the benefit of a direct mass--observable relation. To make use of these samples, it is crucial to characterize any statistical bias and dispersion associate with the cluster mass measurements. The noisy nature of weak lensing measurements makes the Eddington bias the dominant systematic error in these mass estimates. By carefully taking the Eddington bias into account, we will demonstrate that our results can not only recover the underlying mass function for shear-selected cluster samples but also explained the anomalous X-ray properties previously observed in these samples.